english versionPublikationen
2012 | |
| 53. |
Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy J. Welker, F. J. Giessibl Science 336 , 444-449 (2012) (full text) 
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| 52. |
How local is the Phantom Force? T. Wutscher, A. J. Weymouth, F. J. Giessibl arXiv:1203.2258v1 , (2012) |
| 51. |
Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy J. Welker, E. Illek, F. J. Giessibl Beilstein J. Nanotechnol. , 3, 238-248 (2012) |
| 50. |
qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution M. Schneiderbauer, D. Wastl, F. J. Giessibl Beilstein J. Nanotechnol. , 3, 174-178 (2012) |
2011 | |
| 49. |
Atomic Force Microscopy at Ambient and Liquid Conditions with Stiff Sensors and Small Amplitudes E. Wutscher, F. J. Giessibl Rev. Sci. Instrum., 82, 093703 (2011) |
| 48. |
Application of the equipartition theorem to the thermal excitation of quartz tuning forks J. Welker, F. de Faria-Elsner, and F. J. Giessibl Appl. Phys. Lett., 99, 084102 (2011) |
| 47. |
A comparative study of force sensors for scanning probe microscopy based on quartz tuning forks and length extensional resonators F. J. Giessibl, F. Pielmeier, T. Eguchi, T. An, Y. Hasegawa Phys. Rev. B, 84, 125409 (2011) |
| 46. |
Phantom force induced by tunneling current: A characterization on Si(111) A. J. Weymouth, T. Wutscher, J. Welker, T. Hofmann, and F. J. Giessibl Phys. Rev. Lett. 106, 226801 (2011) |
| 45. |
In Situ Cleavage of Crystallographic Oriented Tips for Scanning Probe Microscopy T. Wutscher, F. J. Giessibl Rev. Sci. Instrum., 82, 026106 (2011) |
| 44. |
Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts M. Ternes, C. González, C. P. Lutz, P. Hapala, F. J. Giessibl, P. Jelínek, A. J. Heinrich Phys. Rev. Lett. , 106, 016802 (2011) |
2010 | |
| 43. |
Preparation of light-atom tips for Scanning Probe Microscopy by explosive delamination T. Hofmann, J. Welker, F. J. Giessibl Journal of Vacuum Science and Technology B 28, C4E28-C4E30 (2010) |
| 42. |
Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy R. C. Tung, T. Wutscher, D. Martinez-Martin, R. G. Reifenberger, F. J. Giessibl, und A. Raman Journal of Applied Physics 107, 104508 (2010) |
2009 | |
| 41. |
Auf die Spitze getrieben F. J. Giessibl Physik Journal 8 , Nr. 11, 20-21 (2009) |
| 40. |
Measuring Noncontact Atomic Force Microscopy 2 (Nanoscience and Technology) S. Morita, F. J. Giessibl, R. Wiesendanger (editors) Springer, Berlin ,2009 |
| 39. |
Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy L. Gross, F. Mohn, P. Liljeroth, J. Repp, F. J. Giessibl, G. Meyer Science 324, 1428-1431 (2009) 
YouTube Video: IBM Takes Next Step Towards Building Molecular Device
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2008 | |
| 38. |
Rasterkraftmikroskopie: Wie viel Kraft ist nötig, um ein Atom zu bewegen? M. Ternes, A. J. Heinrich, F. J. Giessibl Physik in unserer Zeit 39, 111-112 (2008)
YouTube Video: IBM Measures The Force Required To Move Atoms
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| 37. |
The Force Needed to Move an Atom on a Surface M. Ternes, C. P. Lutz, C. F. Hirjibehedin, F. J. Giessibl, A. J. Heinrich, Science 319, 1066 (2008)
YouTube Video: IBM Measures The Force Required To Move Atoms
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| 36. |
Searching atomic spin contrast on nickel oxide (001) by force microscopy M. Schmid, J. Mannhart, F. J. Giessibl Phys. Rev. B 77, 045402 (2008) |
2007 | |
| 35. |
Ein atomarer Fingerabdruck F. J. Giessibl Physik Journal 6 , Nr. 5, 22-23 (2007) |
2006 | |
| 34. |
Exploring the Nanoworld with Atomic Force Microscopy F. J. Giessibl, C. F. Quate Physics Today 59, 44-50 (2006) |
| 33.5. |
Device for in situ cleaving of hard crystals M. Schmid, A. Renner, F. J. Giessibl Rev. Sci. Instrum. 77, 036101 (2006) |
| 33. |
Higher-Harmonic Atomic Force Microscopy F. J. Giessibl Surf. Interface Anal. 38, 1696-1701 (2006) |
2005 | |
| 32. |
AFM´s Path to Atomic Resolution F. J. Giessibl materials today 8, 32-41 (2005) |
| 31. |
Electron Scattering in Scanning Probe Microscopy Experiments L. A. Zotti, W. A. Hofer, F. J. Giessibl Chemical Physical Letters 420, 177-182 (2006) |
| 30. |
Investigating Atomic Details of the CaF2(111) Surface with a qPlus Sensor F. J. Giessibl, M. Reichling Nanotechnology 16, 118-124 (2005) |
| 29. |
Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces and Dissipation on Graphite S. Hembacher, F. J. Giessibl, J. Mannhart, C. F. Quate Phys. Rev. Lett. 94, 056101 (1-4) (2005) |
| 28. |
Simultaneous Current-, Force- and Work-Function Measurement with Atomic Resolution M. Herz, C. Schiller, F. J. Giessibl, J. Mannhart Applied Physics Letters 86, 153101 (1-3) (2005) |
2004 | |
| 27. |
Force Microscopy with Light Atom Probes S. Hembacher, F. J. Giessibl, J. Mannhart Science 305, 380-383 (2004) |
| 26. |
Noncontact Atomic Force Microscopy and its Related Topics S. Morita, F. J. Giessibl, Y. Sugawara, H. Hosoi, K. Mukasa, A. Sasahara, H. Onishi Chapter 13 in B. Bhushan (Ed.) "Nanotribology and Nanomechanics", Springer Berlin a.o. 2004, 385-411 (2004) |
| 25. |
Silicon and Its Vital Role in The Evolution of Scanning Probe Microscopy F. J. Giessibl in P. Siffert, E. F. Krimmel (Eds.) "Silicon, Evolution and Future of a Technology", Springer, Berlin, 191-204 (2004) |
| 24. |
Stability Consideration and Implementation of Cantilevers Allowing Dynamic Force Microscopy with Optimal Resolution: the qplus Sensor F. J. Giessibl, S. Hembacher, M. Herz, C. Schiller, J. Mannhart Nanotechnology 15, S79-S86 (2004) |
2003 | |
| 23. |
Advances in Atomic Force Microscopy F. J. Giessibl Reviews of Modern Physics 75 (3), 949-983 (2003) |
| 22. |
Atomic Force Microscopy on Its Way to Adolescence F. J. Giessibl AIP Conference Proceedings 696 (1), 60-67 (2003) |
| 21. |
Principle of High-Resolution Atomic Force Microscopy F. J. Giessibl 34th IFF Spring School 2003, "Fundamentals of Nanoelectronics", ed. by S. Blügel et al. (Schriften des Forschungszentrums Jülich, Reihe Materie und Material, Vol. 14, ISBN 3-89336-319-X, B2.1-B2.12 (2003) |
| 20. |
Probing the shape of atoms in real space M. Herz, F. J. Giessibl, J. Mannhart Physical Review B 68, 045301 (1-7) (2003) |
| 19. |
Revealing the Hidden Atom in Graphite by Low-Temperature Atomic Force Microscopy S. Hembacher, F. J. Giessibl, J. Mannhart, C. F. Quate Proceedings of the National Academy of Sciences PNAS 100, 12539-12542 (2003) |
2002 | |
| 18. |
Evaluation of a Force Sensor Based on a Quartz Tuning Fork for Operation at Low Temperatures and Ultra-High Vacuum S. Hembacher, F. J. Giessibl, J. Mannhart Applied Surface Science 188, 445-449 (2002) |
| 17. |
Friction Traced to the Single Atom F. J. Giessibl, M. Herz, J. Mannhart Proceedings of the National Academy of Sciences 99 (19), 12006-12010 (2002) |
| 16. |
Principle of NC-AFM F. J. Giessibl Noncontact Atomic Force Microscopy, eds. Seizo Morita and Roland Wiesendanger, Ernst Meyer, Springer, Chap. 2, 11-46 (2002) |
| 15. |
Pushing the Resolution Limits of the Force Microscope: from Steps to Atoms and Atomic Orbitals F. J. Giessibl Proceedings of Scanning Probe Microscopy, Nishny Novgorod 2002, 172-174 (2002) |
2001 | |
| 14. |
A Direct Method to Calculate Tip-Sample Forces from Frequency Shifts in Frequency-Modulation Atomic Force Microscopy F. J. Giessibl Applied Physics Letters 78, 123-125 (2001) |
| 13. |
Imaging of Atomic Orbitals with the Atomic Force Microscope - Experiments and Simulations F. J. Giessibl, H. Bielefeldt, S. Hembacher, J. Mannhart Annalen der Physik (Leipzig) 10 (11-12), 887-910 (2001) |
| 12. |
Imaging Silicon with Crystallographically Oriented Tips by Atomic Force Microscopy F. J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart Proceedings of NC-AFM 2000 Applied Physics A 72, 15-17 (2001) |
| 11. |
Rasterkraftmikroskop sieht erstmals in das Innere des Atoms F. J. Giessibl Spektrum der Wissenschaft April, 12-14 (2001) |
2000 | |
| 9. |
Atomic Resolution on Si(111)-(7×7) by Noncontact Atomic Force Microscopy with a Force Sensor based on a Quartz Tuning Fork F. J. Giessibl Applied Physics Letters 76, 1470-1472 (2000) |
| 8. |
Physical Interpretation of Frequency-Modulation Atomic Force Microscopy F. J. Giessibl, H. Bielefeldt Physical Review B 61, 9968-9971 (2000) |
| 7. |
Subatomic Features on the Silicon(111)-(7×7) Surface Observed by Atomic Force Microscopy F. J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart Science 289, 422-425 (2000) |
1999 | |
| 6. |
A Simplified but Intuitive Analytical Model for Intermittent-Contact Mode Force Microscopy Based on Hertzian Mechanics H. Bielefeldt, F. J. Giessibl Surface Science Letters 440, L863-L867 (1999) |
| 5. |
Calculation of the Optimal Imaging Parameters for Frequency Modulation Atomic Force Microscopy F. J. Giessibl, H. Bielefeldt, S. Hembacher, J. Mannhart Applied Surface Science 140, 352-357 (1999) |
| 4. |
Force Microscopy in Vacuum with Atomic Resolution F. J. Giessibl Proc. STM '99, 10th Int. Conf. of Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy, Edited by Y. Kuk, I.W. Lyo, D. Jeon, S.-I.-Park, 19-20 (1999) |
1998 | |
| 3. |
High-Speed Force Sensor for Force Microscopy and Profilometry Utilizing a Quartz Tuning Fork F. J. Giessibl Applied Physics Letters 73, 3956-3958 (1998) |
1997 | |
| 2. |
Forces and Frequency Shifts in Atomic Resolution Dynamic Force Microscopy F. J. Giessibl Physical Review B 56, 16010-16015 (1997) |
| 1. |
Self Oscillating Mode for Frequency Modulation Non-Contact Atomic Force Microscopy F. J. Giessibl, M. Tortonese Applied Physics Letters 70, 2529-2531 (1997) |
