Goals:
- Reaching the physical resolution limit of STM and AFM
- sensors with optimized physical properties
- low temperatures
- tips with defined chemical composition and structure
- Improve understanding of tip-sample interaction
- Simplifying STM and AFM operation for
- applications in difficult environment (UHV, low temperatures)
- tool to study insulators
- 1. image, 2. identify, 3. manipulate any atomic species on any surface
(crystal & amorphous) in all environments (vacuum, gas, liquid)
Current Research:
- Advanced Tip Preparation
- atomic resolution on HOPG with NC-AFM under ambient conditions
- bias dependance of the imaging contrast for AFM/STM on Si(111)
- Scanning Probe Microscopy with light element tips
- construction of a low temperature AFM/STM
- construction of a AFM/STM with field ion microscope (FIM)
Scanning Probe Micorscopes
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