A measure for the state of knowledge
on a certain semiconductor material system is the degree to which microscopic,
parameter–free simulations are able to predict the behavior of
real–world devices. For GaInAs, InGaPAs, and GaAsSb the degree of
predictive power of the highest–level microscopic simulations is
striking. One reason for this success is the high material quality and epitaxial growth control. Inhomogeneous broadening in these
devices is typically low and nonradiative
recombination negligible. The group III–nitrides are
far from this level of understanding, because of the complexity of the system.
Quantum well (QW) fluctuations are intrinsic to this material class due to
indium segregation. Strong internal piezoelectric and spontaneous fields cause
the reduction of the electron and hole wave function
and a red shift (quantum confined Stark effect, QCSE) in all structures grown
along the crystallographic c–axis. The role of threading dislocations and
cause of other nonradiative centers in the wavelength
range from UV to green is the topic of intense discussions. The claim that
Auger processes can be neglected in this wide–bandgap
material is more a hope than a proven statement. Certainly (Al,In)GaN light emitting diodes (LED) and laser diodes (LD)
occupy a huge market segment in optoelectronic devices, which will further grow
when LEDs for general and automotive lighting and LDs
for full color laser projection become available. On the theory side, gain
spectra have been successfully compared to microscopic simulations. Yet nobody
is able at the moment to predict or optimize a full (Al,In)GaN LD or LED structure
without close feedback with experiments and at least some assumptions in form
of adjustable parameters, most notably inhomogeneous broadening.
In our laboratory we employ the Hakki-Paoli method of optical gain spectroscopy. This
method derives the optical gain with high accuracy from the modulation depth
(finesse) of the longitudinal modes below threshold. Information on the laser
diode properties can either be drawn directly from the gain spectra (internal
losses, substrate modes, degradation, gain fluctuations,…)
or via comparison to theoretical models, in particular with (mostly) parameter
free microscopic models.
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Optical gain spectra of laser diodes from Nichia Corporation. The gain
spectra of laser diodes with lasing wavelengths of375nm, 405nm, 440nm, and 470nm
from near UV to aquamarine spectral range show an increasing inhomogeneous
broadening for longer wavelengths [K. Kojima et al., Optics Express 15, 7730
(2007)] |
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Looking
into the “eye” of an (Al,In)GaN laser diode: 405 nm (here: spontaneous) emission
emerging at the laser facet. (Bottom to top: heat spreader; laser diode on
bulk GaN substrate; bond wire).
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Near-field
measurement (inset) of the 2d waveguide mode intensity profile (left) below
and (right) above the onset of filamentation for a
narrow and broad ridge waveguide laser diode, respectively.
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Single
dislocations act as centers of nonradiative
recombination. Left: near bandgap emission
(integrated D0X intensity) in bulk GaN,
the dark spots are dislocations. Middle and right: the energy shift of the
donor bound exciton line has the shape of a dipole
at every dislocation. The cause of this is a strain dipole (compressive and
tensile strain) from a single lattice plane ending at the threading
dislocation line [N. Gmeinwieser et al., Phys. Rev.
B 75, 245213 (2007)].
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The
orientation of these strain dipoles shows a six-fold symmetry, indicating the
orientation of the burgers vector in the hexagonal lattice. This is a pure optical
detection of the Burgers vector.
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One of the most pressing physical
problems hindering further advances in nitride emitters is the presence of
large piezoelectric fields in these materials. Because of the hexagonal lattice
symmetry without a center of inversion the
piezoelectric coefficients for wurtzite nitrides are
non-zero. The active regions of nitride LEDs or laser
diodes are typically comprised of InGaN quantum wells
(QWs) which are under biaxial compressive stress due
to the larger lattice constant of InGaN compared to GaN. Consequently, In-GaN quantum
wells grown along the crystallographic c-axis exhibit an internal piezoelectric
field in the MV/cm range, and electrons and holes are pulled to opposite
interfaces of the QW. This spatial separation of wave functions causes a
decrease of the transition matrix element and suppresses radiative
recombination with respect to nonradiative
recombination, diminishing the efficiency drastically. The problem becomes
worse both for thicker QWs and at higher indium
content, necessary in devices designed for longer wavelength operation. In
order to overcome these problems nitride heterostructures
and QWs need to be grown along crystallographic
directions where the piezoelectric field is small or zero.
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Piezoelectric polarization of an InxGa1–xN
quantum well grown pseudomorphically between
relaxed GaN barriers. The lattice planes of
particular polar, semipolar, and nonpolar orientations are shown as insets. P′z
is the polarization perpendicular to the growth plane [U. T. Schwarz and M. Kneissl, phys. stat. sol. (RRL) 1, A45 (2007)]. |
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Spiral staircase (
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Screw
dislocation in a crystal (red: dislocation line; black: Burgers vector)..
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Phase
front of an optical vortex.
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Experimentally determined configuration of polarization singularities
(L surface and C lines) in (x,y,L)-space[F. Flossmann
et al., Phys. Rev. Lett. 95, 253901 (2005)]. |
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Beam intensity patterns of even IGMs, IGe p,m,
measured with the CCD camera and (b) their theoretical predictions [U. T.
Schwarz et al., Optics Letters 29,
1870 (2004)]. |